Lucy Lu graduated with a bachelor of engineering degree from The Xian University of Science and Technology, China in 1989. She then received her Master’s engineering degree from The Xian University of Science and Technology in 1992. She was an associate professor at the Xian University of Science and Technology from 1993 to 1998 where she did research and lecturing in optical and electronic measurement technology and applications. She has over 10 publications in international journals and conferences. In 1999, she was a research associate at The Hong Kong Polytechnic University and concentrated to establish new mathematics model to describe 3-D profile objectively. She currently works on strain silicon microelectronics device testing at Belford Research Inc.